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Based on PSoC Smart Sensor of Gas Density
Автор: admin | 21 Апр 2010
УДК 621.317
Based on PSoC Smart Sensor of Gas Density
V.F. Zavorotnyi, R. Chobik, A.V. Borisov
На основе программируемой системы на кристалле (PSoC) и тонкопленочной МЕМС структуры разработан смарт-сенсор, использующий новый метод определения плотности газа. Этот сенсор имеет такие преимущества перед аналогами, как стабильность характеристик, долговечность, малые размеры, наличие ряда стандартных цифровых и беспроводного интерфейсов. На основе PSoC выполнены все необходимые компоненты измерительной системы. Беспроводный интерфейс обеспечивается дополнительным чипом с 2,4 ГГц радио передатчиком с расширением спектра прямой последовательностью (DSSS) и Гауссовской частотной манипуляцией (GFSK) (производства корпорации Cypress Semiconductor). При выполнении на традиционных компонентах измерительная система была бы громоздкой и дорогой.
On the basis of the Programmable System-onChip (PSoC) and thin-film МЕМS structure the smart gas sensor was developed by using newest method for determination of the gas density. This sensor has such advantages against analogues as stability of characteristics, durability, small sizes, presence of a set of standard digital and wireless interfaces. On the basis of one chip PSoC all necessary components of measuring system are executed. The wireless interface is provided by additional chip with 2.4- GHz Direct-Sequencing Spread Spectrum (DSSS) Gaussian Frequency Shift Keying (GFSK) radio transceiver (Cypress Semiconductor Corp.). If it accomplish on traditional microcircuits, the measuring system will be quite hard and costly. Introduction Last ten – fifteen years the tendency to creation socalled «intellectual gauges», representing the independent information-measuring systems is denoted. Such smart-sensors are capable to carry out self-diagnostics, digital transformation of the analog information incoming from the gauge was designated, and also to compensate lacks (nonlinearity of function of transformation, dependence on external influences). The further development of this direction is seems in expansion of functionality and intellectualization of measuring systems on the chip. Products such as «laboratory on the chip» can become fast-growing branch of the semi-conductor industry. The opportunity of mass application of tiny devices for performance of the analysis outside of laboratory in field conditions essentially reduces time necessary for carrying out of the analysis. Therefore everywhere, where terms and expenses for reception of results of the analysis play a paramount role, there is a potential consumer of products. The basic trends for the technological decision of development problems of measuring systems on the chip are using of МEМS technology achievements, (and in near prospect NEМS) and supply of sensor controls by rudiments of intelligence as the microprocessor with memory. Functional coupling between electronic and micro-electro-mechanical systems allow creating the new measurement methods. “Smart” sensors with embedded microprocessors and wireless communication links have the potential to change fundamentally the way industrial and home infrastructure systems are monitored, controlled, and maintained [1]. Indeed, a 2002 National Research Council report noted that the use of networked systems of embedded computers and sensors throughout society could well dwarf all previous milestones in the information revolution. The design, fabrication, and construction of smart structures are one of the ultimate challenges to engineering researchers today. Because they form the essence of system intelligence, one of the cores of smart structures technology centres on innovative sensors and sensor systems.
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Темы: Твердотельная электроника | Комментариев нет